Product line architecture recovery with outlier filtering in software families: the Apo-Games case study

Journal of the Brazilian Computer Society

Table 6 PLA metrics after eliminating some variants and threshold analysis (classes)

EV	SSC	SVC	RSC	RVC	CO	OR	CM	R
0	0.01	0.99	0.00	1.00	278	625	19	7
1	0.08	0.92	0.02	0.98	205	465	19	7
2	0.10	0.90	0.02	0.98	157	365	19	7
3	0.13	0.87	0.02	0.98	126	313	19	7
4	0.15	0.85	0.02	0.98	107	263	19	7
Application of the threshold analysis
13%	0.26	0.74	0.07	0.93	56	91	19	7
26%	0.32	0.68	0.20	0.80	42	56	19	7
38%	0.38	0.62	0.20	0.80	32	37	19	7
51%	0.46	0.54	0.30	0.70	23	18	19	7

Legends:EV eliminated variants, SSC structure similarity coefficient, SVC structure variability coefficient, RSC relation similarity coefficient, RVC relation variability coefficient, CO ClassOptional, OR OptionalRelation, CM ClassMandatory, R MandatoryRelation